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Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements

✍ Scribed by Chih-Hung Chen; Deen, M.J.; Yuhua Cheng; Matloubian, M.


Book ID
111675710
Publisher
IEEE
Year
2001
Tongue
English
Weight
254 KB
Volume
48
Category
Article
ISSN
0018-9383

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