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Experimental evaluation of testability measures for test generation (logic circuits)

✍ Scribed by Chandra, S.J.; Patel, J.H.

Book ID: 119777655
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 547 KB
Volume: 8
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.21822

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