Excess noise in dc SQUIDs from 4.2K to 0.022K
β Scribed by Wellstood, F.; Urbina, C.; Clarke, J.
- Book ID
- 114648864
- Publisher
- IEEE
- Year
- 1987
- Tongue
- English
- Weight
- 477 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0018-9464
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π SIMILAR VOLUMES
A two-channel DC-SQUID voltmeter developed for the measurement of low-field Hall coefficient and electrical resistance of high-purity copper single crystals between 4.2 and 100 K is described. The noise is 1.8 pVHz -1/2 at 4.2 K and increases to 12 pVHz -1/2 at 100 K. A sample current up to 2.5 Γ an
We have fabricated thin-film dc SQUIDS (Superconducting Quantum Interference Devices) incorporating Nb/Al-Oxide/Nb tunnel junctions. The spectral density of the voltage noise, Sv, of stripline SQUIDS is characterized between 1 Hz and 2000 Hz. responsivi ?% aV/acP) over a significant ran In this fre