EXAFS studies of interfaces in bilayers and multilayers

✍ Scribed by S.M. Heald; H. Chen; G.M. Lamble

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 394 KB
• Volume: 158
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/0921-4526(89)90294-9

✦ Synopsis

EXAFS is demonstrated to be a useful probe of interface structure. Glancing angle techniques can be used on bilayer samples for cases in which the overlayer iJ less dense than the substrate. It is shown that the anomalous dispersion distortion8 which aflect the EXAFS signal can be accurately removed using an analytic model for So and PO, allowing quantitative analysis to be carried out. Examples are given for the Cu-Al system. In other cases multilayer sample8 can be employed to enhance the interface signal, as is illustrated by results on W-C multilayers. A disadvantage of multilayers is that two type8 of interfaces are simultaneously probed. To deal with this standing wave technique8 can be employed to selectivity enhance the EXAFS signal from region8 within the multilayer unit cell, and results on Ni-Ti demon&ate the fea8ibility of this approach.