𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Atom probe analysis and modelling of interfaces in magnetic multilayers

✍ Scribed by Amanda K. Petford-Long; Alfred Cerezo; Jonathan M. Hyde

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
989 KB
Volume
47
Category
Article
ISSN
0304-3991

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Atomic resolution STEM analysis of defec
Atomic resolution STEM analysis of defects and interfaces in ceramic materials
✍ R.F. Klie; Y. Zhu πŸ“‚ Article πŸ“… 2005 πŸ› Elsevier Science 🌐 English βš– 875 KB

Atomic resolution scanning transmission electron microscopy (STEM) analysis, in particular the combination of Z-contrast imaging and electron energy-loss spectroscopy (EELS) has been successfully used to measure the atomic and electronic structure of materials with sub-nanometer spatial resolution.