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Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1−xCdxTe

✍ Scribed by Glennis J. Orloff; John A. Woollam; Ping He; William A. McGahan; J.R. McNeil; R.D. Jacobson; Blaine Johs

No coin nor oath required. For personal study only.

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