Ex situ spectroscopic ellipsometry investigation of the layered structure of polycrystalline diamond thin films grown by electron cyclotron resonance-assisted chemical vapor deposition

✍ Scribed by Gupta, S.; Weiner, B. R.; Morell, G.

• Book ID: 121313297
• Publisher: American Institute of Physics
• Year: 2001
• Tongue: English
• Weight: 899 KB
• Volume: 90
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1384487