Thin films of Al substituted cobalt ferrite layers on thermally oxidized silicon wafers were fabricated by a sol-gel method with various annealing temperatures. The structural and magnetic properties of the films were investigated with a X-ray diffractometer, a vibrating sample magnetometer (VSM) an
✦ LIBER ✦
Evidence for structural instability in edges of A1 and A1−0.3% Mg thin films
✍ Scribed by W.R. Stowell; R.M. Rose
- Publisher
- Elsevier Science
- Year
- 1969
- Tongue
- English
- Weight
- 135 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0375-9601
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