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Evidence for bistable defects in 6H-SiC

✍ Scribed by P. Staikov; D. Baum; J.Y. Lin; H.X. Jiang

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 391 KB
Volume: 89
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(94)90501-0

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