Evaluation of Surface Cleaning of Si(211) for Molecular-Beam Epitaxy Deposition of Infrared Detectors

✍ Scribed by M. Jaime-Vasquez; R. N. Jacobs; J. D. Benson; A. J. Stoltz; L. A. Almeida; L. O. Bubulac; Y. Chen; G. Brill

• Book ID: 107455840
• Publisher: Springer US
• Year: 2010
• Tongue: English
• Weight: 476 KB
• Volume: 39
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-010-1152-1