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In situ reflection electron energy loss spectroscopy measurements of low temperature surface cleaning for Si molecular beam epitaxy

โœ Scribed by Nikzad, Shouleh; Wong, Selmer S.; Ahn, Channing C.; Smith, Aimee L.; Atwater, Harry A.


Book ID
121261727
Publisher
American Institute of Physics
Year
1993
Tongue
English
Weight
777 KB
Volume
63
Category
Article
ISSN
0003-6951

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