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Evaluation of Residual Stress in Thin Ferroelectric Films Using Grazing Incident X-Ray Diffraction

✍ Scribed by PETROV, Peter KR.; SARMA, KUMARAVINOTHAN; ALFORD, NEIL MCN.

Book ID: 126634350
Publisher: Taylor and Francis Group
Year: 2004
Tongue: English
Weight: 120 KB
Volume: 63
Category: Article
ISSN: 1058-4587
DOI: 10.1080/10584580490459431

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