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Evaluating the Signal-Reliability of Logic Circuits

✍ Scribed by Koh, Kyung-Shik

Book ID: 117935168
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 384 KB
Volume: R-34
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.1985.5222129

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