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ESR of silicon oxide thin-film capacitors

✍ Scribed by R Paez; L.C Hernández; J.I Jaramillo; P Prieto; J Rodríguez; G Fritsch


Publisher
Elsevier Science
Year
1978
Weight
235 KB
Volume
29
Category
Article
ISSN
0022-2364

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Dielectric Properties of Tin Oxide Thin
✍ Dr. J. Siva Kumar; Dr. U. V. Subba Rao 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 260 KB 👁 1 views

Thin films of several thicknesses in the form of MIM structures are prepared from the powders of tin oxide (SnO,) by thermal evaporation technique in a vacuum of Torr. The dielectric properties of tin oxide film capacitors have been studied with temperatures varying from 77 to 400 K and also with fr