Thin films of several thicknesses in the form of MIM structures are prepared from the powders of tin oxide (SnO,) by thermal evaporation technique in a vacuum of Torr. The dielectric properties of tin oxide film capacitors have been studied with temperatures varying from 77 to 400 K and also with fr
โฆ LIBER โฆ
Dielectric and electrical studies on Samarium Oxide thin film capacitors
โ Scribed by M. Chandra Shekab; J. Siva Kumar; Dr. U. V. Subba Rao; V. Hari Babu
- Publisher
- John Wiley and Sons
- Year
- 1984
- Tongue
- English
- Weight
- 263 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0232-1300
No coin nor oath required. For personal study only.
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