Thin films of several thicknesses in the form of MIM structures are prepared from the powders of tin oxide (SnO,) by thermal evaporation technique in a vacuum of Torr. The dielectric properties of tin oxide film capacitors have been studied with temperatures varying from 77 to 400 K and also with fr
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Dielectric response of dysprosium oxide thin film capacitors in frequency domain
โ Scribed by T. Wiktorczyk
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Volume
- 67
- Category
- Article
- ISSN
- 0038-1098
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