We compare the ability of three different equivalent-circuit extraction methods to give ensembles of model parameters that accurately predict not only average S-parameters but the S-parameter statistics, i.e., the standard deviations and intercorrelations between the real and imaginary parts. Measur
β¦ LIBER β¦
Equivalent-circuit parameter extraction for cold GaAs MESFET's
β Scribed by Anholt, R.; Swirhun, S.
- Book ID
- 114553782
- Publisher
- IEEE
- Year
- 1991
- Tongue
- English
- Weight
- 556 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0018-9480
- DOI
- 10.1109/22.85396
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