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Parameter extraction technique for HBT equivalent circuit using cutoff mode measurement

✍ Scribed by Lee, S.; Gopinath, A.


Book ID
111879146
Publisher
IEEE
Year
1992
Tongue
English
Weight
423 KB
Volume
40
Category
Article
ISSN
0018-9480

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## Abstract An improved pad‐deembedding technique for InGaP/GaAs HBT reducing uncertainty in measurement and equivalent circuit is proposed. Intrinsic elements are obtained by iteratively determining the external and internal base resistance. The extracted equivalent circuits demonstrate good agree