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EPR Monitoring of Annealing Effects in F-Implanted Amorphous Silicon

✍ Scribed by Goltzene, A. ;Meyer, B. ;Schwab, C. ;Liu, X. H. ;Bohringer, K. ;Kalbitzer, S.

Book ID: 105378670
Publisher: John Wiley and Sons
Year: 1985
Tongue: English
Weight: 169 KB
Volume: 91
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210910150

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