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Epitaxial strain energy measurements of GaN on sapphire by Raman spectroscopy

✍ Scribed by H. J. Park; C. Park; S. Yeo; S.W. Kang; M. Mastro; O. Kryliouk; T. J. Anderson

Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 149 KB
Volume: 2
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200461513

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