Epitaxial growth of thin films of V2VI3semiconductors
โ Scribed by B. Gardes; J. Ameziane; G. Brun; J. C. Tedenac; A. Boyer
- Publisher
- Springer
- Year
- 1994
- Tongue
- English
- Weight
- 267 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0022-2461
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โฆ Synopsis
Epitaxial growth conditions of V2Vl 3 semiconductors have been studied using the molecular beam epitaxy technique, which was applied to the growth of SbzTe3 on Bi2Te 3 substrates. These substrates were prepared by gradient freeze method in a Bridgman apparatus. Ingots were cleaved along the (0001) plane. The deposition conditions have been studied as a function of two parameters: substrate temperature and flux ratios of the two elements. The quality of these epilayers was controlled by SEM and X-ray diffraction. Epilayers of good quality have been obtained for the first time.
๐ SIMILAR VOLUMES
A new theoretical model for prediction of the mechanism of growth of thm epitaxial films is developed. The model is not based on the classical nucleation theory as this is the case of the approach of B~WI to the problem. The thermodynamic conditions for occurrence of island growth, layer-by-layer gr