✦ LIBER ✦

Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy

✍ Scribed by Castellano-Hernández, E; Moreno-Llorena, J; Sáenz, J J; Sacha, G M

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Quantitative dielectric constant measure

✍ Gramse, G; Casuso, I; Toset, J; Fumagalli, L; Gomila, G 📂 Article 📅 2009 🏛 Institute of Physics 🌐 English ⚖ 913 KB

A Study of Electrostatic Charge on Insul

✍ Kikunaga, K; Toosaka, K; Kamohara, T; Sakai, K; Nonaka, K 📂 Article 📅 2011 🏛 Institute of Physics 🌐 English ⚖ 638 KB

Quantifying the dielectric constant of t

✍ Gramse, G; Gomila, G; Fumagalli, L 📂 Article 📅 2012 🏛 Institute of Physics 🌐 English ⚖ 1006 KB

Formation of Si-based organic thin films

✍ Toshiaki Fujii; Mineo Hiramatsu; Masahito Nawata 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 349 KB

Atomic Force Microscopy Study of the Hyd

✍ Sirghi, L.; Nakamura, M.; Hatanaka, Y.; Takai, O. 📂 Article 📅 2001 🏛 American Chemical Society 🌐 English ⚖ 135 KB

The interface formation and adhesion of

✍ K.S. Kim; Y.C. Jang; H.J. Kim; Y.-C. Quan; J. Choi; D. Jung; N.-E. Lee 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 330 KB