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Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe

✍ Scribed by Gramse, G; Gomila, G; Fumagalli, L

Book ID: 111873593
Publisher: Institute of Physics
Year: 2012
Tongue: English
Weight: 1006 KB
Volume: 23
Category: Article
ISSN: 0957-4484
DOI: 10.1088/0957-4484/23/20/205703

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