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The interlayer screening effect of graphene sheets investigated by Kelvin probe force microscopy

✍ Scribed by Lee, N. J.; Yoo, J. W.; Choi, Y. J.; Kang, C. J.; Jeon, D. Y.; Kim, D. C.; Seo, S.; Chung, H. J.

Book ID: 120014882
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 680 KB
Volume: 95
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3269597

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## Abstract Kelvin probe force microscopy (KPFM) is usually applied to map the local surface potential of nanostructured materials at surfaces and interfaces. KPFM is commonly defined as a ‘surface technique’, even if this assumption is not fully justified. However, a quantification of the surface