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The effect of sample resistivity on Kelvin probe force microscopy

✍ Scribed by Weymouth, A. J.; Giessibl, F. J.

Book ID: 120001420
Publisher: American Institute of Physics
Year: 2012
Tongue: English
Weight: 697 KB
Volume: 101
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.4766185

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