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Kelvin probe force microscopy of semiconductor surface defects

✍ Scribed by Rosenwaks, Y.; Shikler, R.; Glatzel, Th.; Sadewasser, S.

Book ID
111650187
Publisher
The American Physical Society
Year
2004
Tongue
English
Weight
475 KB
Volume
70
Category
Article
ISSN
1098-0121

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The local contact potential di †erence (CPD) of di †erent self-assembled n-alkanethiol monolayers on Au substrates has been measured using Kelvin probe force microscopy (KPFM). Our results demonstrate that KPFM can be used to obtain topography and CPD information simultaneously. The measured CPDs sh