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Engineering density of semiconductor-dielectric interface states to modulate threshold voltage in OFETs

✍ Scribed by Wang, A.; Kymissis, I.; Bulovic, V.; Akinwande, A.I.

Book ID: 114618054
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 410 KB
Volume: 53
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2005.860633

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