Temperature Dependence of Threshold Voltage of Metal-Semiconductor Field Effect Transistors in the Presence of an Uneven Distribution of Interface and Bulk States

✍ Scribed by Chattopadhyay, P. ;Pal, J. ;Majumdar, L. ;Sanyal, S. ;Ray, M.

• Publisher: John Wiley and Sons
• Year: 1996
• Tongue: English
• Weight: 355 KB
• Volume: 155
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211550127