✦ LIBER ✦
The distribution of mobile carriers in the pinch-off region of an insulated-gate field-effect transistor and its influence on device breakdown : G. A. Armstrong and J. A. Magowan. Solid State Electron.14 (1971), p. 723
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 109 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0026-2714
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