Energy band structure of quantum-size metal-oxide-semiconductor field effect transistor
β Scribed by Y. Fu; M. Karlsteen; M. Willander
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 169 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0749-6036
No coin nor oath required. For personal study only.
β¦ Synopsis
We have investigated the energy band structure of the 40 nm gate length n-metal-oxidesemiconductor field effect transistor (MOSFET) recently fabricated by M. Ono, M. Saito, T. Yoshitomi, C. Fiegna, T. Ohguro and H. Iwai (IEEE Transaction on Electron Devices 42: 1822 (1995)). By the classical particle picture, the conducting channel at zero gate bias is already open. When the one-dimensional quantum effect along the sample growth direction is included, the semiclassical model gives an increased threshold voltage. It is shown here that the large measured threshold voltage and therefore the success of a short-length MOSFET working at room temperature are well explained when the three-dimensional quantization effect is included.
π SIMILAR VOLUMES
The metal-oxide-semiconductor (MOS) field effect transistor (FET) using 'oxidized Β΅c-Si/ultrathin oxide' gate structure was studied. It was found that this structure shows negative differential resistance behavior, which can be explained by the Coulomb blockade effect of trapped carriers and immedia
Directed self-assembly techniques, such as fluidic self-assembly, [1][2][3] liquid-solder-based self-assembly, [4,5] self-assembly using capillary forces in fluid, [6,7] and shape-and-solder-directed self-assembly, [8,9] has been studied by many researchers in recent years in order to implement micr