Ellipsometry of anisotropic thin films
β Scribed by De Smet, D. J.
- Book ID
- 115383499
- Publisher
- Optical Society of America
- Year
- 1974
- Weight
- 949 KB
- Volume
- 64
- Category
- Article
- ISSN
- 0030-3941
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π SIMILAR VOLUMES
This contribution presents 4 Γ 4 matrices for generalized ellipsometry analysis of dielectric helical thin films within the algebraic framework for arbitrary anisotropic layered samples. Liquid crystal and solid-state material optical properties are used to demonstrate dielectric helical thin film e
Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The determination of the thickness of each of two metal