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Perpendicular-incidence photometric ellipsometry of biaxial anisotropic thin films

✍ Scribed by Zuber, Alexander ;Jänchen, Heidrun ;Kaiser, Norbert

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Ellipsometry of anisotropic thin films

✍ De Smet, D. J. 📂 Article 📅 1974 🏛 Optical Society of America ⚖ 949 KB

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✍ JOHNSON, J. A.; BASHARA, N. M. 📂 Article 📅 1971 🏛 Optical Society of America ⚖ 652 KB

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