The mechanism of plating on anodized aluminum was investigated . Porous anodic films were formed on 1100 aluminum and the electrochemical behaviour of a number of test reactions (Ag\*/As, Cur'/C,4[Fe(CN) 6 ]Β° /[Fe(CN)6]3 -and QH 2 /Qwas determined . Hydrogen evolution can damage the oxide film and e
Ellipsometric measurements of the barrier layer in composite aluminum oxide films
β Scribed by C.K. Dyer; R.S. Alwitt
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 715 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0013-4686
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β¦ Synopsis
Ahatract -The composite oxide film (hydrous + anodic) formed on aluminum foil was chemically stripped to remove only the outer hydrous layer. Ellipsometry of the remaining barrier film showed it to be thinner and have a higher refractive index than conventional anodic barrier films grown to the same voltage. Reanodization to improve film stability gave a further increase in refractive index which indicated that the barrier film had contained some voids. The barrier film is almost entirely crystalline y-Al,O, and the higher field strenplth compared with conventional amorphous anodic films on aluminum is believed to be a character&&c of the denser oxide.
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