𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Ellipsometric measurements on tantalum and tantalum oxide films and variation of the optical constants with structure

✍ Scribed by Rosa M. Aguado Bombin; W.E.J. Neal


Publisher
Elsevier Science
Year
1977
Tongue
English
Weight
293 KB
Volume
42
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Heat treatment induced structural and op
✍ S. V. Jagadeesh Chandra; G. Mohan Rao; S. Uthanna πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 142 KB πŸ‘ 1 views

## Abstract Rf magnetron sputtering technique was employed for preparation of tantalum oxide films on quartz and crystalline silicon (111) substrates held at room temperature by sputtering of tantalum in an oxygen partial pressure of 1x10^‐4^ mbar. The films were annealed in air for an hour in the

The structure of anodic filmsβ€”I. An elec
✍ P.H.G Draper; J Harvey πŸ“‚ Article πŸ“… 1963 πŸ› Elsevier Science βš– 999 KB

It has been shown previously that the kinetics of anodic film growth on Ta, Nb and Zr often depend strongly on the nature of the electrolyte. This work is an attempt to resolve this anomaly and the inconsistencies in the reported structures of the oxide layers. Electron diffraction showed the anodic