✦ LIBER ✦
Analytic solutions for optimized ellipsometric measurements of interfaces and surface layers in thin film structures
✍ Scribed by Samuel A. Alterovitz; George H. Bu-Abbud; John A. Woollam
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 638 KB
- Volume
- 123
- Category
- Article
- ISSN
- 0040-6090
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