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Ellipsometric and Raman spectroscopic study of nanocrystalline silicon thin films prepared by a rf magnetron sputtering technique

✍ Scribed by Bouizem, Y; Abbes, C; Sib, J D; Benlakehal, D; Baghdad, R; Chahed, L; Zellama, K; Charvet, S

No coin nor oath required. For personal study only.

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