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elemental redistribution and interfacial reaction mechanism for the flip chip Sn-3.0Ag-(0.5 or 1.5)Cu solder bump with Al/Ni(V)/Cu under-Bump metallization during aging

โœ Scribed by Guh-Yaw Jang; Jenq-Gong Duh


Publisher
Springer US
Year
2006
Tongue
English
Weight
584 KB
Volume
35
Category
Article
ISSN
0361-5235

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