Electronic traps and Pb centers at the Si/SiO2 interface: Band-gap energy distribution

✍ Scribed by Poindexter, E. H.; Gerardi, G. J.; Rueckel, M.-E.; Caplan, P. J.; Johnson, N. M.; Biegelsen, D. K.

• Book ID: 125853590
• Publisher: American Institute of Physics
• Year: 1984
• Tongue: English
• Weight: 710 KB
• Volume: 56
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.333819