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Electronic structure of a metal-insulator interface

✍ Scribed by G. Bordier; C. Noguera

Book ID
118364622
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
511 KB
Volume
251-252
Category
Article
ISSN
0039-6028

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The method of metal-insulator-semiconductor (MIS) structure interface analysis, based on applying a direct current pulse of preset amplitude to a MIS structure, is proposed. The variation of the voltage across the MIS structure is recorded while the current flows. The method allows measurement of in