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Electronic and level statistics properties of Si/SiO2 quantum dots

✍ Scribed by I. Filikhin; S.G. Matinyan; B.K. Schmid; B. Vlahovic

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 764 KB
Volume: 42
Category: Article
ISSN: 1386-9477
DOI: 10.1016/j.physe.2010.02.024

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