Electron trapping probabilities in hydrogen ion implanted silicon dioxide films thermally grown on polycrystalline silicon

✍ Scribed by V.K Gueorguiev; Tz.E Ivanov; C.A Dimitriadis; L.I Popova; S.K Andreev

• Book ID: 108361737
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 137 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(99)00137-8