✦ LIBER ✦
Electron trapping levels in silicon dioxide thermally grown on silicon : J.H. Thomas, III and F.J. Feigl, Materials Research Center and Department of Physics, Lehigh University, Bethlehem, Pennsylvania 18015, U.S.A.
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 89 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0038-1098
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