Electron mobility in Si delta doped GaAs
β Scribed by P.M. Koenraad; A.F.W. van de Stadt; J.M. Shi; G.Q. Hai; N. Studart; P. Vansant; F.M. Peeters; J.T. Devreese; J.A.A.J. Perenboom; J.H. Wolter
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 241 KB
- Volume
- 211
- Category
- Article
- ISSN
- 0921-4526
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π SIMILAR VOLUMES
Due to the complicated artefacts in SIMS depth profiling, SIMS depth resolution is difficult to evaluate. For evaluation of the SIMS depth resolution, delta-doped layers are more useful than sharp interfaces, because the matrix effect and the sputtering rate change can be minimized in profiling thro
In this paper we report abnormal non-ohmic behaviour observed in Si \(\delta\)-doped GaAs. We have performed measurements in Hall bar and Van der Pauw geometries in which electron transport phenomena can be studied by looking into the dependence of the device resistance \(\boldsymbol{R}_{x x}\) on t