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Electron microscopy characterization of TiN films on Si, grown by d.c. reactive magnetron sputtering

✍ Scribed by B. Pécz; N. Frangis; S. Logothetidis; I. Alexandrou; P.B. Barna; J. Stoemenos


Book ID
107864706
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
986 KB
Volume
268
Category
Article
ISSN
0040-6090

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