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Electron microscope and electron diffraction studies of amorphization phenomena in Ge implanted with Te ions

✍ Scribed by Pashov, N. ;Kätner, G. ;Kalitzova, M. ;Simov, S. ;Mikhailov, M. ;Kolev, K.


Publisher
John Wiley and Sons
Year
1984
Tongue
English
Weight
321 KB
Volume
84
Category
Article
ISSN
0031-8965

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