✦ LIBER ✦
Ion implantation damage in GaAs: A TEM study of the variation with ion species and stoichiometry : Charles R. Elliott, Thomas Ambridge and Roger Heckingbottom. Solid-St. Electron. 21, 859 (1978)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 39 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-2714
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