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Electron-Induced Single-Event Upsets in Static Random Access Memory

โœ Scribed by King, M. P.; Reed, R. A.; Weller, R. A.; Mendenhall, M. H.; Schrimpf, R. D.; Sierawski, B. D.; Sternberg, A. L.; Narasimham, B.; Wang, J. K.; Pitta, E.; Bartz, B.; Reed, D.; Monzel, C.; Baumann, R. C.; Deng, X.; Pellish, J. A.; Berg, M. D.; Seidleck, C. M.; Auden, E. C.; Weeden-Wright, S. L.; Gaspard, N. J.; Zhang, C. X.; Fleetwood, D. M.


Book ID
121461349
Publisher
IEEE
Year
2013
Tongue
English
Weight
660 KB
Volume
60
Category
Article
ISSN
0018-9499

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