Electron-Induced Single-Event Upsets in Static Random Access Memory

✍ Scribed by King, M. P.; Reed, R. A.; Weller, R. A.; Mendenhall, M. H.; Schrimpf, R. D.; Sierawski, B. D.; Sternberg, A. L.; Narasimham, B.; Wang, J. K.; Pitta, E.; Bartz, B.; Reed, D.; Monzel, C.; Baumann, R. C.; Deng, X.; Pellish, J. A.; Berg, M. D.; Seidleck, C. M.; Auden, E. C.; Weeden-Wright, S. L.; Gaspard, N. J.; Zhang, C. X.; Fleetwood, D. M.

• Book ID: 121461349
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 660 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2013.2286523