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Further Development of a Novel Neutron Detector Using the Single Event Upset Phenomenon in Dynamic Random Access Memories

✍ Scribed by J. Brushwood; S. Harvey; P. A. Beeley; N. M. Spyrou


Book ID
110240547
Publisher
Springer
Year
2000
Tongue
English
Weight
468 KB
Volume
244
Category
Article
ISSN
1588-2780

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