Use of PuBe source to simulate neutron-induced single event upsets in static RAMs

✍ Scribed by Normand, E.; Wert, J.L.; Doherty, W.R.; Oberg, D.L.; Measel, P.R.; Criswell, T.L.

• Book ID: 114554629
• Publisher: IEEE
• Year: 1988
• Tongue: English
• Weight: 558 KB
• Volume: 35
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.25491