Electron beam lithography of copolymeric resists containing styrenes and allyl acrylates
โ Scribed by Jing Shu; Wei Lee; Larry Venable; Gil Varnell
- Book ID
- 104520338
- Publisher
- Society for Plastic Engineers
- Year
- 1983
- Tongue
- English
- Weight
- 482 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0032-3888
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Resist profiles in PMMA are simulated for the case of single and triple layer electron beam lithography. Line width variations and edge slopes are compared in two cases. Improvements in line width variation and edge slopes have been shown to occur after proximity exposure correction. Further in the
## Abstract **Summary:** A novel process for the synthesis of nanocomposite films containing silver nanoparticles is presented. Unlike conventional synthetic processes, silver nanoparticles and the polymer film constituting the nanocomposite film were synthesized simultaneously through an in situ e